Time：March 14, 2014, 9:00 am
Location：Energy Building #2, meeting room at the 8th floor
Lecturer：Presenter: Prof. Wuqiang Yang
School of Electrical and Electronic Engineering, the University of Manchester, UK
Introduction：
Professor Wuqiang Yang (FIET, FInstMC, FIEEE, CEng) received all his BEng (Distinction) 1982, MSc 1985 and PhD (Distinction) 1988, from Tsinghua University. After 3 years as a Lecturer at Tsinghua University, he joined UMIST in 1991. His research is focused on electrical capacitance tomography (ECT), has published 300 papers and a book "Sensor Array", and holds 10 patents, including 2 WO patents, which have been licensed to industry. He is an Associate Editor of IEEE Trans. IM and an editorial board member of 7 other journals, including Meas. Sci. Technol. and Sensor Review, and reviews papers for 40 journals, including 6 IEEE journals. He has been invited by many universities and research institutions worldwide and international conferences to give lectures/seminars/keynotes. He is a visiting professor at 6 universities, including Tsinghua University. He is recognised by International Center for Scientific Research (France), as one of top 30 technology researchers in the world, and Intota as an expert. Since 2010, he is an IEEE IMS Distinguished Lecturer.
In 2006 he received Global Research Award from the Royal Academy of Eng. and took sabbatical leave at Massachusetts Institute of Technology (MIT) in USA as a visiting professor. He has received many awards, including 1997 IEE/NPL Wheatstone Measurement Prize, 1997 Honeywell Prize from Inst MC, 2000 IEE Ayrton Premium, 2008 Outstanding Organization award from IEEE IM Society, 2009 Valued Reviewer from Sensors and Actuators journal, 2009 IET Innovation Award Finalist, and 2010 Outstanding Reviewer from Sensor Review journal. He was an honorary chairman of IEEE Int. Conference on Imaging Systems and Techniques 2009-2013, and also the local chairman of IST'2012, IST'2013 and SMC'2013 conferences. He organised 2 special issues in 2013 for IEEE Trans. IM and Meas. Sci. Technol. as a Guest Editor.